发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device includes at least one thin-film transistor, which includes a semiconductor layer, a gate electrode and a gate insulating film. In the semiconductor layer, a crystalline region, including a channel forming region, a source region and a drain region, is defined. The gate electrode is provided to control the conductivity of the channel forming region. The gate insulating film is provided between the gate electrode and the semiconductor layer. The semiconductor layer includes a gettering region outside of the crystalline region thereof.
申请公布号 US2003201442(A1) 申请公布日期 2003.10.30
申请号 US20030421841 申请日期 2003.04.24
申请人 MAKITA NAOKI 发明人 MAKITA NAOKI
分类号 G02F1/1368;H01L21/20;H01L21/322;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/423;H01L29/49;H01L29/786;(IPC1-7):H01L29/76 主分类号 G02F1/1368
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