发明名称 METHODS USED IN FABRICATING GATES IN INTEGRATED CIRCUIT DEVICE STRUCTURES
摘要 <p>One embodiment of the present invention is a method used to fabricate devices on a substrate, which method is utilized at a stage of processing wherein a dummy gate that includes gate electrode material and gate dielectric material is exposed, which method includes steps of: (a) flowing one or more gases into a plasma generator disposed outside a processing chamber containing the substrate; and (b) flowing output from the plasma generator into the processing chamber so that the substrate is exposed to species that selectively etch the gate electrode material.</p>
申请公布号 WO2003090275(P1) 申请公布日期 2003.10.30
申请号 US2003011922 申请日期 2003.04.16
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