发明名称 Connection terminals and manufacturing method of the same, semiconductor device and manufacturing method of the same
摘要 A first protection film (3) and a second protection film (4) are formed on an electrode pad (2). Bumps (5) are formed at sites where the deposited first and second protection films (3), (4) are both removed. The openings (3a) where the lower, first protection film (3) is removed are larger than the openings (4a) where the upper, second protection film (4) is removed, so that the upper, second protection film (4) has an overhanging structure. The bottom periphery of the bump (5) is formed to extend under the second protection film (4).
申请公布号 US2003203661(A1) 申请公布日期 2003.10.30
申请号 US20030422749 申请日期 2003.04.25
申请人 ONO ATSUSHI;ASAZU TAKURO;YAMAGUCHI SHINJI 发明人 ONO ATSUSHI;ASAZU TAKURO;YAMAGUCHI SHINJI
分类号 H01L21/60;H01L23/485;(IPC1-7):H05K1/00;H01R12/00 主分类号 H01L21/60
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