发明名称 |
High-transmittance halftone phase shift mask and manufacturing method of semiconductor device |
摘要 |
The high-transmittance halftone phase shift mask is structured, in a first phase shift pattern region, with a transmission region exposing a transparent substrate and having a rectangular (square) two-dimensional shape; a phase shift region surrounding the transmissive region exposing halftone phase shift film and having a rectangular shape two-dimensional shape; and a light shielding region surrounding the phase shift region and formed of a light shielding film provided on the halftone phase shift film. With the present mask, a high-transmittance halftone phase shift mask that can transfer desired pattern clearly on the photosensitive resin and a method for producing semiconductor devices using the mask can be attained. |
申请公布号 |
US2003203286(A1) |
申请公布日期 |
2003.10.30 |
申请号 |
US20020282193 |
申请日期 |
2002.10.29 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
MAESHIMA KIYOSHI;TAMADA NAOHISA |
分类号 |
G03F1/08;G03F1/00;G03F1/29;G03F1/32;G03F1/68;G03F7/20;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
G03F1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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