发明名称 Power supply voltage fluctuation analyzing method
摘要 There is provided a power supply voltage fluctuation analyzing method which performs power supply voltage fluctuation analysis for a semiconductor product, and the method comprises a step of determining a power consumption distribution in each function cell of the semiconductor product by using a power supply portion position and a ratio of each portion based on stored information of an input library which stores therein the power supply portion position and ratio information for each function cell of the semiconductor product, and allocating a power consumption to each function cell.
申请公布号 US2003204340(A1) 申请公布日期 2003.10.30
申请号 US20030420753 申请日期 2003.04.23
申请人 NEC ELECTRONICS CORPORATION 发明人 OOTOUGE KAZUO
分类号 G01R31/28;G06F17/50;H01L21/82;(IPC1-7):G06F19/00;G01R21/00;G01R21/06 主分类号 G01R31/28
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