发明名称 DEPOSITION METHOD OVER MIXED SUBSTRATES USING TRISILANE
摘要 Trisilane is used in chemical vapor deposition methods to deposit silicon-containing films over mixed substrates. Such methods are useful in semiconductor manufacturing to provide a variety of advantages, including uniform deposition over heterogeneous surfaces, high deposition rates, and higher manufacturing productivity. An example is in forming the base region of a heterojunction bipolar transistor, including simultaneous deposition over both single crystal semiconductor surfaces and amorphous insulating regions.
申请公布号 WO02065517(A3) 申请公布日期 2003.10.30
申请号 WO2002US04750 申请日期 2002.02.12
申请人 ASM AMERICA, INC. 发明人 TODD, MICHAEL, A.
分类号 C23C16/24;C23C16/02;C23C16/42;C30B25/02;H01L21/20;H01L21/205;H01L21/28;H01L21/285;H01L21/316;H01L21/331;H01L21/337;H01L21/425;H01L21/469;H01L21/8238;H01L27/092;H01L29/51;H01L29/737;H01L29/78;H01L31/18;H01L31/20 主分类号 C23C16/24
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