发明名称 Arrangement and method for transferring a pattern from a mask to a wafer
摘要 An arrangement for transferring a pattern from a mask (100) onto a wafer is provided. A product area (110) of the mask (100) is at least partly surrounded by a frame (112) having an alignment mark area (114). In order to avoid the need to produce a specific mask set for different alignment styles, the mask (100) and the frame (112) are designed as being separate units. Further, methods for transferring a pattern from a mask to a wafer are provided that employ a frame separated from a product area.
申请公布号 US2003202181(A1) 申请公布日期 2003.10.30
申请号 US20020135463 申请日期 2002.04.30
申请人 MALTABES JOHN GEORGE;CHARLES ALAIN BERNARD;MAUTZ KARL E. 发明人 MALTABES JOHN GEORGE;CHARLES ALAIN BERNARD;MAUTZ KARL E.
分类号 G03F1/14;G03F9/00;(IPC1-7):G01B11/00 主分类号 G03F1/14
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