发明名称 Semiconductor wafer and method for fabricating the same
摘要 A Si substrate 1 with a SiGeC crystal layer 8 deposited thereon is annealed to form an annealed SiGeC crystal layer 10 on the Si substrate 1. The annealed SiGeC crystal layer includes a matrix SiGeC crystal layer 7, which is lattice-relieved and hardly has dislocations, and SiC microcrystals 6 dispersed in the matrix SiGeC crystal layer 7. A Si crystal layer is then deposited on the annealed SiGeC crystal layer 10, to form a strained Si crystal layer 4 hardly having dislocations.
申请公布号 US2003203599(A1) 申请公布日期 2003.10.30
申请号 US20030414106 申请日期 2003.04.16
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO. , LTD. 发明人 KANZAWA YOSHIHIKO;NOZAWA KATSUYA;SAITOH TOHRU;KUBO MINORU
分类号 H01L21/205;C30B33/00;H01L21/20;H01L29/10;H01L29/165;H01L29/24;(IPC1-7):H01L21/00;C30B1/00;H01L21/42 主分类号 H01L21/205
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