发明名称 |
DRAM with vertical transistors and deep trench capacitors |
摘要 |
A DRAM cell with a vertical transistor and a deep trench capacitor. In the DRAM cell, a deep trench capacitor is desposed in a substrate; a gate is disposed over the deep trench capacitor; an ion doped layer is disposed between the gate and an upper electrode of the capacitor; an insulating layer is disposed between the gate and the ion doped layer; a gate insulating layer is disposed on a sidewall of the gate; a channel region is located beside the gate insulating layer in the substrate; a source is disposed on a sidewall of the ion doped layer and on one side of the vertical channel region; and a common drain is disposed on the other side of the vertical channel region. The DRAM cell can be applied to an open bitline DRAM, a folder bitline DRAM, and a foler bitline DRAM with bordless bitline contact window.
|
申请公布号 |
US2003201481(A1) |
申请公布日期 |
2003.10.30 |
申请号 |
US20030453502 |
申请日期 |
2003.06.04 |
申请人 |
NANYA TECHNOLOGY CORPORATION |
发明人 |
HEO KUEN-CHY;LIN JENG-PING |
分类号 |
H01L21/8242;H01L27/02;H01L27/108;H01L29/94;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|