发明名称 DRAM with vertical transistors and deep trench capacitors
摘要 A DRAM cell with a vertical transistor and a deep trench capacitor. In the DRAM cell, a deep trench capacitor is desposed in a substrate; a gate is disposed over the deep trench capacitor; an ion doped layer is disposed between the gate and an upper electrode of the capacitor; an insulating layer is disposed between the gate and the ion doped layer; a gate insulating layer is disposed on a sidewall of the gate; a channel region is located beside the gate insulating layer in the substrate; a source is disposed on a sidewall of the ion doped layer and on one side of the vertical channel region; and a common drain is disposed on the other side of the vertical channel region. The DRAM cell can be applied to an open bitline DRAM, a folder bitline DRAM, and a foler bitline DRAM with bordless bitline contact window.
申请公布号 US2003201481(A1) 申请公布日期 2003.10.30
申请号 US20030453502 申请日期 2003.06.04
申请人 NANYA TECHNOLOGY CORPORATION 发明人 HEO KUEN-CHY;LIN JENG-PING
分类号 H01L21/8242;H01L27/02;H01L27/108;H01L29/94;(IPC1-7):H01L27/108 主分类号 H01L21/8242
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