发明名称 PROFILOGRAPH
摘要 FIELD: measurement technology, devices testing surface roughness. SUBSTANCE: invention is based on magnification of three-dimensional interference picture by microscope, on copying of preliminary holographic image of surface microrelief. Scanning indicator of electromagnetic field is employed for measurement. EFFECT: raised precision, increased number of feeling routes, reduced time of operational registration, possibility of examination of real picture of microrelief. 3 dwg
申请公布号 RU2215317(C2) 申请公布日期 2003.10.27
申请号 RU20020100574 申请日期 2002.01.08
申请人 ORLOVSKIJ GOSUDARSTVENNYJ TEKHNICHESKIJ UNIVERSITE 发明人 STEPANOV JU.S.;BELKIN E.A.;BARSUKOV G.V.
分类号 G03H1/00;G01B21/20 主分类号 G03H1/00
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