| 摘要 |
PROBLEM TO BE SOLVED: To provide a maintenance information providing system, a device and a method therefor capable of reducing both the user side cost and maker side cost required for maintenance by enabling to cope, on the user side, with a deficiency generated in semiconductor integrated circuit testing device. SOLUTION: A maintenance information providing server 12 is connected to a network N, and provides maintenance information acquired by correlating information on a past defect generation spot of the semiconductor integrated circuit testing device with a diagnosis result of a self-diagnosis program function provided in the semiconductor integrated circuit testing device. Terminal devices 24, 34 connected to the network N transmit the diagnosis result of the self- diagnosis program function of the testing devices 20, 30 to the maintenance information providing server 12 corresponding to user operation, and acquires information on the defect generation spot. COPYRIGHT: (C)2004,JPO
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