发明名称 PROBE CONTACT DEVICE FOR DISPLAY PANEL INSPECTION
摘要 PROBLEM TO BE SOLVED: To miniaturize a probe contact device when inspecting a display panel. SOLUTION: A plurality of probes 22a are provided on the tip of a probe carrying leg 14, and a press block carrying leg 16 for opening and closing relatively to the probe carrying leg 14 is provided. A press block 24 provided on the tip of the press block carrying leg 16 faces relatively to the probes 22a across the display panel 12 with a prescribed pressing force. Hereby, the relative pressing force between the probe carrying leg 14 and the press block carrying leg 16 is never applied to a support part or the display panel. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003302439(A) 申请公布日期 2003.10.24
申请号 JP20020106557 申请日期 2002.04.09
申请人 TOKYO CATHODE LABORATORY CO LTD 发明人 KATO MAMORU;MURAKAMI TETSUO;KUMAZAWA HIROSHI;KONO HAJIME;MINE MEGUMI;NINOMIYA SATOSHI
分类号 G01R1/06;G01R31/02;G01R31/28;G02F1/1345;(IPC1-7):G01R31/02 主分类号 G01R1/06
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