发明名称 |
PROBE CONTACT DEVICE FOR DISPLAY PANEL INSPECTION |
摘要 |
PROBLEM TO BE SOLVED: To miniaturize a probe contact device when inspecting a display panel. SOLUTION: A plurality of probes 22a are provided on the tip of a probe carrying leg 14, and a press block carrying leg 16 for opening and closing relatively to the probe carrying leg 14 is provided. A press block 24 provided on the tip of the press block carrying leg 16 faces relatively to the probes 22a across the display panel 12 with a prescribed pressing force. Hereby, the relative pressing force between the probe carrying leg 14 and the press block carrying leg 16 is never applied to a support part or the display panel. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2003302439(A) |
申请公布日期 |
2003.10.24 |
申请号 |
JP20020106557 |
申请日期 |
2002.04.09 |
申请人 |
TOKYO CATHODE LABORATORY CO LTD |
发明人 |
KATO MAMORU;MURAKAMI TETSUO;KUMAZAWA HIROSHI;KONO HAJIME;MINE MEGUMI;NINOMIYA SATOSHI |
分类号 |
G01R1/06;G01R31/02;G01R31/28;G02F1/1345;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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