发明名称 ION-DOPING EQUIPMENT AND ION-DOPING METHOD
摘要 PROBLEM TO BE SOLVED: To provide ion-doping equipment wherein the ratio of ion species to be implanted is stabilized and the high precision control of dosage is enabled in the ion-doping equipment. SOLUTION: This ion-doping equipment is provided with a gas inlet means, an ion-generating means, an extraction accelerating means, and a doping chamber which has an ion source surrounded by a double-structure wall having a gap and has a holding means which is continuously connected with the ion source and holds a substrate to exposed to the flow of the ions. The gap is filled with a medium for heating or cooling. The temperature of the inner wall of the ion source is kept constant by heating the wall to at least a temperature wherein an increase in temperature is caused by self heat generation or by cooling the wall to room temperature, or lower by using an ion-generating means. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003303784(A) 申请公布日期 2003.10.24
申请号 JP20020104586 申请日期 2002.04.05
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 NAKAMURA OSAMU;HIZUKA JUNICHI
分类号 H01J27/16;H01J37/08;H01J37/317;H01L21/265;H01L21/336;H01L29/786;(IPC1-7):H01L21/265 主分类号 H01J27/16
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