| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which a memory array region is divided independently without affecting each other and a self test of internal memory itself can be performed with one internal memory and less hardware constitution. SOLUTION: In a semiconductor memory device in which write-in and read- out of data are performed for a memory array in accordance with address information, the device is provided with an address converting circuit 23 generating new address information by performing some change for one part or all of the address information in accordance with a control signal for test. In this address converting circuit 23, a memory array is divided into a test program region 32 and a memory region 31 to be tested in accordance with the control signal for test. For example, in the address converting circuit 23, new address information is obtained by replacing address bits of the prescribed numbers of a bit column constituting the address information. COPYRIGHT: (C)2004,JPO
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