发明名称 METHOD FOR PRODUCTION OF A CAPACITIVE STRUCTURE ABOVE A METALLISATION LEVEL OF AN ELECTRONIC COMPONENT
摘要 The invention relates to a capacitive structure above a metallisation level of an electronic component. Said structure comprises two electrodes separated by a layer of dielectric material, the first electrode being electrically connected to the metallisation level, characterised in that the first electrode (22) has a slotted structure, covering the form of a number of regions (20) of material with low relative permittivity arranged above the level of metallisation (3), the layer of dielectric material (23) covers the first electrode, the second electrode (28) covers the layer of dielectric material and fills the troughs of the slotted stricture and has a connection pad (33) on the upper face thereof. The invention further relates to a method for production of such a capacitive structure.
申请公布号 WO03088328(A2) 申请公布日期 2003.10.23
申请号 WO2003FR01245 申请日期 2003.04.17
申请人 GIRARDIE, LIONEL 发明人 GIRARDIE, LIONEL
分类号 C23C16/40;C23C16/44;C23C16/455;H01L21/28;H01L21/316;H01L29/51 主分类号 C23C16/40
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