发明名称 MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 The invention provides a memory device including a memory substrate, an insulating layer, a shielding metal layer, a second dielectric layer and a second metal layer. The memory substrate includes a substrate, a memory cell area, a peripheral circuit area, a first dielectric layer and a first metal layer. The first dielectric layer is formed on the memory area and the peripheral circuit area, which are formed on the substrate. The first metal layer is formed on the first dielectric layer while the insulating layer is formed on the first dielectric layer not covered with the first metal layer. The shielding metal layer is formed on the insulating layer over the memory cell area. The second dielectric layer is formed on the shielding metal layer, the insulating layer not covered with the shielding metal layer and the first metal layer not covered with both the shielding layer and the insulating layer. The second metal layer is formed on the second dielectric layer.
申请公布号 US2003198095(A1) 申请公布日期 2003.10.23
申请号 US20020193634 申请日期 2002.07.10
申请人 LIU KUANG-WEN;HUANG CHONG-JEN;LU JUI-LIN 发明人 LIU KUANG-WEN;HUANG CHONG-JEN;LU JUI-LIN
分类号 H01L21/336;H01L21/8234;H01L21/8239;H01L21/8244;H01L21/8246;H01L23/552;H01L27/105;H01L27/115;H01L29/76;(IPC1-7):H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址