发明名称 Method for manufacturing semiconductor device, semiconductor device, electro-optical device, and electronic apparatus
摘要 The invention provides a method of manufacturing a semiconductor device, capable of enhancing characteristics of each semiconductor element constituting the semiconductor device, while reducing or suppressing non-uniformity in the characteristics thereof. When forming a thin-film circuit constructed by arranging a plurality of pixel circuits on a glass substrate, first, a plurality of concave portions to be seeds in crystallizing a semiconductor film are formed on the glass substrate with a pitch n times an array pitch of a plurality of pixel circuits. Then, an amorphous silicon film is formed on the glass substrate on which the concave portions are formed, and by crystallizing the silicon film by heating, a substantially monocrystalline silicon film is formed within a region centered on the concave portions. Using each of the substantially monocrystalline silicon film formed substantially centered around the respective concave portions, pixel circuits are formed.
申请公布号 US2003197222(A1) 申请公布日期 2003.10.23
申请号 US20030394059 申请日期 2003.03.24
申请人 SEIKO EPSON CORPORATION 发明人 HARA HIROYUKI;INOUE SATOSHI
分类号 G02F1/1368;G09F9/30;H01L21/20;H01L21/268;H01L21/336;H01L21/77;H01L27/12;H01L27/32;H01L29/786;(IPC1-7):H01L27/01 主分类号 G02F1/1368
代理机构 代理人
主权项
地址