发明名称 X-RAY EXAMINATION APPARATUS FOR RECONSTRUCTING A THREE-DIMENSIONAL DATA SET FROM PROJECTION IMAGES
摘要 An X-ray examination apparatus includes an X-ray source and an X-ray detector and is arranged to provide a series of projection images at respective orientations of the X-ray source (1) and the X-ray detector (2) relative to a predetermined frame of reference. The orientations of the projection images are calibrated relative to this frame of reference. A basic three-dimensional data set (23) is reconstructed from the projection images. A number of directions of observations (121-123) are calibrated relative to the same frame of reference. One or more additional X-ray images (11-113) are formed for the calibrated directions of observation, that is, preferably at successive instants in time. A dynamic series of three-dimensional data sets is formed by updating the basic three-dimensional data set by means of the additional X-ray images.
申请公布号 WO03015033(A3) 申请公布日期 2003.10.23
申请号 WO2002IB03142 申请日期 2002.07.25
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS CORPORATE INTELLECTUAL PROPERTY GMBH 发明人 OP DE BEEK, JOHANNES, C., A.;KOPPE, REINER;KLOTZ, ERHARD, P., A.
分类号 A61B6/00;A61B6/02;G06T1/00;G06T3/00;G06T11/00 主分类号 A61B6/00
代理机构 代理人
主权项
地址