发明名称 |
Wave guided alternating phase shift mask and fabrication method thereof |
摘要 |
A wave guided alternating phase shift mask (WGAPSM) includes a substrate transparent to light from an exposure light source and a waveguide pattern formed on the substrate to define a plurality of transparent regions that are regularly arranged. The transparent regions defined by the waveguide pattern include a plurality of shift transparent regions formed of recess regions of the substrate and a plurality of non-shift transparent regions alternatively arranged with the shift transparent regions. The provided WGAPSM minimizes an error of critical dimension difference and an X-effect while securing a large process margin and not generating opaque defects. A fabricating method for the provided WGAPSM is also provided. |
申请公布号 |
US2003198875(A1) |
申请公布日期 |
2003.10.23 |
申请号 |
US20030414217 |
申请日期 |
2003.04.16 |
申请人 |
KIM SEONG-HYUCK;JEONG TAE-MOON;SHIN IN-KYUN |
发明人 |
KIM SEONG-HYUCK;JEONG TAE-MOON;SHIN IN-KYUN |
分类号 |
G02B5/18;G03F1/00;G03F1/08;G03F1/14;G03F1/30;G03F1/68;H01L21/027;(IPC1-7):G03F1/00 |
主分类号 |
G02B5/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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