发明名称 TEST PROGRAM EMULATOR AND EMULATION METHOD FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE: A test program emulator and an emulation method for a semiconductor device are provided to detect an error, which is not detected by a computer, in a test program of the semiconductor device. CONSTITUTION: An emulator controller program(130) forms test items by loading a semiconductor device specification and the test program stored in a file, and interpreting a sentence of the test program, and stores the test items in a virtual register. An emulator execution program(120) executes the test program virtually and extracts a virtual test result of an instruction compared with the semiconductor device specification. An emulator decision program(140) decides a conformance of the test program by comparing the virtual test result with the semiconductor device specification, and outputs a decision result.
申请公布号 KR20030082135(A) 申请公布日期 2003.10.22
申请号 KR20020020711 申请日期 2002.04.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SEOK HWAN
分类号 G06F11/22;G01R31/3183;G06F11/26;(IPC1-7):G06F9/44 主分类号 G06F11/22
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