发明名称 |
METHOD FOR PREVENTING SHORT CHANNEL BY USING TRENCH FORMATION |
摘要 |
PURPOSE: A method for preventing short channel by using trench formation is provided to be capable of preventing reverse short channel phenomenon by transforming the trench filled with thermal oxide into a cavity. CONSTITUTION: A trench pattern is formed at a gate region while forming an STI(Shallow Trench Isolation) pattern. An isolation region(30) is formed by sequentially carrying out an oxide depositing process and a planarization process. Then, the trench pattern is filled with thermal oxide. A cleaning process is carried out at the resultant structure for removing oxide residuals existing at the surface of a silicon substrate. After depositing a selective epitaxial silicon film(50) on the resultant structure, the trench pattern filled with thermal oxide is transformed into a cavity(70) by carrying out a high temperature heat treatment at the deposited film.
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申请公布号 |
KR20030082084(A) |
申请公布日期 |
2003.10.22 |
申请号 |
KR20020020626 |
申请日期 |
2002.04.16 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
LEE, JE YEON |
分类号 |
H01L21/762;(IPC1-7):H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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