发明名称 |
WAFER BACK-SIDE GRIND APPARATUS HAVING WAFER SENSOR |
摘要 |
PURPOSE: A wafer back-side grind apparatus having a wafer sensor is provided to be capable of previously preventing an active surface of a wafer from being carried out with a back-side grinding process. CONSTITUTION: A wafer back-side grind apparatus(200) is provided with a wafer loading unit(210) for sequentially supplying wafers(10), a wafer transfer unit(250) for transferring the wafer, a wafer alignment unit(230), a wafer grind unit(240) for grinding the back-side of the wafer, a wafer unloading unit(260), and a control unit(270) electrically connected with the units for controlling the operation of each unit according to a control program. At this time, a light absorbing film is attached on the wafer as an active surface protecting film. The wafer back-side grind apparatus further includes a wafer sensor(235) installed at the upper portion of the wafer alignment unit for sensing the surface of the wafer and transmitting a signal corresponding to the detected surface to the control unit.
|
申请公布号 |
KR20030081800(A) |
申请公布日期 |
2003.10.22 |
申请号 |
KR20020020206 |
申请日期 |
2002.04.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, CHEOL MIN;KWON, YEONG HAN;LEE, HYEONG JIN;CHO, JEONG SUN;CHO, YEON SANG;HWANG, YEONG GON;CHO, YEONG IL;KWON, MOK GEUN |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|