发明名称 WAFER BACK-SIDE GRIND APPARATUS HAVING WAFER SENSOR
摘要 PURPOSE: A wafer back-side grind apparatus having a wafer sensor is provided to be capable of previously preventing an active surface of a wafer from being carried out with a back-side grinding process. CONSTITUTION: A wafer back-side grind apparatus(200) is provided with a wafer loading unit(210) for sequentially supplying wafers(10), a wafer transfer unit(250) for transferring the wafer, a wafer alignment unit(230), a wafer grind unit(240) for grinding the back-side of the wafer, a wafer unloading unit(260), and a control unit(270) electrically connected with the units for controlling the operation of each unit according to a control program. At this time, a light absorbing film is attached on the wafer as an active surface protecting film. The wafer back-side grind apparatus further includes a wafer sensor(235) installed at the upper portion of the wafer alignment unit for sensing the surface of the wafer and transmitting a signal corresponding to the detected surface to the control unit.
申请公布号 KR20030081800(A) 申请公布日期 2003.10.22
申请号 KR20020020206 申请日期 2002.04.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, CHEOL MIN;KWON, YEONG HAN;LEE, HYEONG JIN;CHO, JEONG SUN;CHO, YEON SANG;HWANG, YEONG GON;CHO, YEONG IL;KWON, MOK GEUN
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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