发明名称 Formation of insulating aluminum oxide in semiconductor substrates
摘要 The present invention provides methods and apparatus for creating insulating layers in Group III-V compound semiconductor structures having aluminum oxide with a substantially stoichiometric compositions. Such insulating layers find applications in a variety of semiconductor devices. For example, in one aspect, the invention provides vertical insulating layers separating two devices, such as photodiodes, formed on a semiconductor substrate from one another. In another aspect, the invention can provide such insulating layers as buried horizontal insulating layers of semiconductor devices.
申请公布号 US6635559(B2) 申请公布日期 2003.10.21
申请号 US20010949030 申请日期 2001.09.06
申请人 SPIRE CORPORATION 发明人 GREENWALD ANTON C.;KALKHORAN NADER MONTAZERNEZAM
分类号 H01L21/28;H01L21/316;H01L21/762;H01L29/51;H01L31/0304;H01L33/14;H01S5/183;(IPC1-7):H01L21/28;H01L21/320 主分类号 H01L21/28
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