发明名称 Method of making metallization and contact structures in an integrated circuit
摘要 The invention concerns a method for forming metallization and contact structures in an integrated circuit. The method involoves the steps of etching a trench in the trench dielectric layer a trench dielectric layer of a composite structure containing a semiconductor substrate comprising an active region, a gate structure thereover, and dielectric spacers adjacent to the gate structure, a contact dielectric layer; and the trench dielectric layer; etching the contact dielectric layer under conditions which do not damage the gate structure to form a first contact opening that exposes a region of the semiconductor substrate; and depositing a conductive material into the contact opening and the trench.
申请公布号 US6635566(B1) 申请公布日期 2003.10.21
申请号 US20000593967 申请日期 2000.06.15
申请人 CYPRESS SEMICONDUCTOR CORPORATION 发明人 BLOSSE ALAIN;THEDKI SANJAY;QIAO JIANMIN;GILBOA YITZHAK
分类号 H01L21/28;H01L21/302;H01L21/3065;H01L21/311;H01L21/60;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/28
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