发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 A barrier layer that meets three requirements, "withstand well against etching and protect a semiconductor film from an etchant as an etching stopper", "allow impurities to move in itself during heat treatment for gettering", and "have excellent reproducibility", is formed and used to getter impurities contained in a semiconductor film. The barrier layer is a silicon oxide film and the ratio of a sub-oxide contained in the barrier layer is 18% or higher.
申请公布号 KR20030081174(A) 申请公布日期 2003.10.17
申请号 KR20030023026 申请日期 2003.04.11
申请人 发明人
分类号 H01L21/20;H01L29/786;H01L21/322;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/423;H01L29/49 主分类号 H01L21/20
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