发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problem that it is difficult to form a plurality of transistors having different threshold voltages on the same semiconductor substrate by adjusting the threshold voltages of the transistors to appropriate values in a completely depleted SOI transistor. SOLUTION: On the silicon active layer (=SOI layer) (of an SOI substrate 104), dummy gate patterns 111 and 112 are formed and, thereafter, gate grooves 130 and 132 are provided by removing the gate patterns 111 and 112. The threshold voltage of each transistor is adjusted by reducing the thickness of a portion constituting a channel region by etching the silicon active layer 103 in the gate grooves 130 and 132. Consequently, the degree of freedom for circuit design can be improved according to conditions. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003298060(A) 申请公布日期 2003.10.17
申请号 JP20020095879 申请日期 2002.03.29
申请人 TOSHIBA CORP 发明人 YAGISHITA JUNJI;SAITO TOMOHIRO
分类号 H01L21/28;H01L21/8234;H01L21/84;H01L27/08;H01L27/088;H01L27/12;H01L29/423;H01L29/49;H01L29/786;(IPC1-7):H01L29/786;H01L21/823 主分类号 H01L21/28
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