发明名称 CLEANER AND DRYER, AND CLEANING AND DRYING METHOD OF SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a cleaner and dryer, and a cleaning and drying method of a semiconductor wafer in which a cleaning and drying effect is enhanced, the waste of cleaning liquid is prevented by circulating and recycling used cleaning liquid, and environmental pollution is reduced. SOLUTION: Cleaning liquid composed of isopropylalcohol (IPA) and ultrapure water is premixed to have a desired concentration before being supplied to a treatment tank 11. Consequently, the removal of residual compounds by ultrapure water and the generation of a water spot by IPA are controlled efficiently. The cleaning and drying effect of a wafer is thereby enhanced and cleaning liquid can be recycled. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003297795(A) 申请公布日期 2003.10.17
申请号 JP20030051446 申请日期 2003.02.27
申请人 A-TECH LTD 发明人 PARK JIN-KOO;LEE JOONG-YEON;YOON NEUNG-GOO;RI SHOKON;LEE SANG-HO
分类号 H01L21/304;B08B3/00;C23G1/00;H01L21/00;H01L21/30;H01L21/302;H01L21/306;(IPC1-7):H01L21/304 主分类号 H01L21/304
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