发明名称 SUBSTRATE TREATMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To supply gas evenly to stacked substrates by unifying the flow volume and flow rate of gas supplied to the stacked substrates. SOLUTION: Inside a reaction tube 6, a buffer chamber 17 formed with buffer chamber holes 3 having an identical opening area is installed. Inside the buffer chamber 17, a gas nozzle 2 formed with gas nozzle holes 4, whose opening area becomes larger going from the upstream towards the downstream of the gas, is installed. The gas, blown out from the gas nozzle 2, is introduced into the buffer chamber 17 once, and after the flow rate of the gas is uniformized, the gas is supplied to wafers 7 through the buffer chamber holes 3. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003297818(A) 申请公布日期 2003.10.17
申请号 JP20020104011 申请日期 2002.04.05
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 KONYA TADASHI;TOYODA KAZUYUKI;SATO TAKETOSHI;KAGAYA TORU;SHIMA NOBUHITO;ISHIMARU NOBUO;SAKAI MASANORI;OKUDA KAZUYUKI;YAGI YASUSHI;WATANABE SEIJI;KUNII YASUO
分类号 C23C16/452;C23C16/455;H01L21/31;(IPC1-7):H01L21/31 主分类号 C23C16/452
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