发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To improve the light resistance of a thin film transistor (TFT) using CG silicon films and to reduce off-current. SOLUTION: Each of the channel layer 19a, source layer 19b, and drain layer 19c of the TFT formed on a quartz substrate 11 having an insulating surface is formed by laminating a p-type Si film 12 which is a first crystalline silicon film and a CG silicon film 13 which is a second crystalline silicon film upon another in this order. The thickness of the CG silicon film 13 is made thinner than that of the p-type Si film 12. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003298064(A) 申请公布日期 2003.10.17
申请号 JP20020099441 申请日期 2002.04.01
申请人 SHARP CORP 发明人 GOTO MASAHITO
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/20
代理机构 代理人
主权项
地址