发明名称 VARIABLE TEMPERATURE PROCESSES FOR TUNABLE ELECTROSTATIC CHUCK
摘要 <p>An etch processor for etching a wafer includes a chuck for holding the wafer and a temperature sensor reporting a temperature of the wafer. The chuck includes a heater controlled by a temperature control system. The temperature sensor is operatively coupled to the temperature control system to maintain the temperature of the chuck at a selectable setpoint temperature. A first setpoint temperature and a second setpoint temperature are selected. The wafer is placed on the chuck and set to the first setpoint temperature. The wafer is then processed for a first period of time at the first setpoint temperature and for a second period of time at the second setpoint temperature.</p>
申请公布号 WO2003085721(P1) 申请公布日期 2003.10.16
申请号 US2003009153 申请日期 2003.03.25
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