发明名称 Method of using hydrogen plasma to pre-clean copper surfaces during Cu/Cu or Cu/metal bonding
摘要 A method of bonding a wire to a metal bonding pad, comprising the following steps. A semiconductor die structure having an exposed metal bonding pad within a chamber is provided. The bonding pad has an upper surface. A hydrogen-plasma is produced within the chamber from a plasma source. The metal bonding pad is pre-cleaned and passivated with the hydrogen-plasma to remove any metal oxide formed on the metal bonding pad upper surface. A wire is then bonded to the passivated metal bonding pad.
申请公布号 US2003192943(A1) 申请公布日期 2003.10.16
申请号 US20020120836 申请日期 2002.04.11
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD. 发明人 SUDIJONO JOHN LEONARD;ALIYU YAKUB;ZHOU MEI SHENG;CHOOI SIMON;GUPTA SUBHASH;ROY SUDIPTO RANENDRA;HO PAUL KWOK KEUNG;XU YI
分类号 C23G5/00;H01L21/306;H01L21/3213;H01L21/607;H01L23/485;(IPC1-7):B23K31/00;B23K31/02;H01L21/44 主分类号 C23G5/00
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