发明名称 |
Semiconductor manufacturer/outsource fabricator intermediation method during semiconductor testing, involves selecting required outsource fabricator based on test specifications registered by manufacturer |
摘要 |
An outsource fabrication consultant (10) is connected between semiconductor manufacturer (2) and outsource fabricators (20) through Internet (6). When the manufacturer requests consultant to select outsource fabricator, the consultant selects required outsource fabricator based on the test specifications registered by the manufacturer and provides an inquiry to the terminals of selected outsource fabricator. An Independent claim is also included for electric apparatus manufacturer/outsource fabricator intermediation method.
|
申请公布号 |
DE10249891(A1) |
申请公布日期 |
2003.10.16 |
申请号 |
DE2002149891 |
申请日期 |
2002.10.25 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO |
发明人 |
YAMADA, TSUYOSHI;NAKANO, TOSHIO;KOSEKO, YASUSHI |
分类号 |
G06Q30/06;G06Q50/00;G06Q50/04;(IPC1-7):G06F17/60 |
主分类号 |
G06Q30/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|