发明名称 SINGLE PASS ATTENUATED TOTAL REFLECTION INFRARED ANALYSIS IDENTIFYING PROTEIN SECONDARY STRUCTURE, SURFACE CHARGE AND BINDING AFFINITY
摘要 <p>Apparatus and method for acquiring an infrared spectrum of a sample is described. In the apparatus a solublized sample suspected of having materials with an infrared spectrum including an amide I band, an amide II band, an amide III band, an amide A band, an OH stretching region or a combination thereof is brought into contact with the functionalized tip of an internal reflecting element (IRE) in a sample cell to form a sample-IRE interface. A beam of infrared radiation is directed from a source through the IRE under conditions that it interacts with the sample-IRE interface once. The reflectane profile of the radiation is detected and recorded over a range of frequencies to obtain an infrared spectrum of the sample. The infrared spectra can be obtained and stored in a database to form a library.</p>
申请公布号 WO2003085422(P1) 申请公布日期 2003.10.16
申请号 US2002028039 申请日期 2002.09.04
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