| 摘要 |
<p>Method for determining a set of distortion measures in a pattern recognition process, where a sequence of feature vectors is formed from a digitized incoming signal to be recognized, said pattern recognition being based upon said set of distortion measures. The method comprises comparing (S10) a first feature vector in said sequence with a first number (M1) of templates from a set of templates representing candidate patterns, based on said comparison, selecting (S12) a second number (M2)of templates from said template set, the second number being smaller than the first number, and comparing (S14) a second feature vector only with said selected templates. The method can be implemented in a device for pattern recognition.</p> |
