| 发明名称 |
Semiconductor test system with easily changed interface unit |
| 摘要 |
A subassembly to aid in changing the interface unit for an automatic test system. The disclosed embodiment shows an automatic test system with a handler and a tester. The interface unit is a device interface board (DIB). The subassembly allows the DIB to be easily accessed, yet can be properly aligned to the test system. No special tools are required to change the DIB.
|
| 申请公布号 |
US2003194821(A1) |
申请公布日期 |
2003.10.16 |
| 申请号 |
US20020173357 |
申请日期 |
2002.06.17 |
| 申请人 |
CHIU MICHAEL A.;BENTLEY NEIL R.;PETITTO WAYNE |
发明人 |
CHIU MICHAEL A.;BENTLEY NEIL R.;PETITTO WAYNE |
| 分类号 |
G01R31/26;G01R31/01;G01R31/28;G01R31/319;(IPC1-7):H01L21/66 |
主分类号 |
G01R31/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
