Integrated circuit test method involves receiving information indicating measured driver tristate leakage current of integrated circuit pad by automated test equipment

摘要

An automated test equipment (ATE) is electrically interconnected with an integrated circuit (IC). A driver in IC pad is configured in a tristated condition and the IC measures the driver tristate leakage current of IC pad. The ATE receives the information indicating the measured leakage current of the IC pad from the IC. Independent claims are also included for the following: (1) integrated circuit; (2) system for measuring tristate leakage currents of drivers of an integrated circuit; and (3) computer-readable medium storing program for facilitating driver tristate testing of an integrated circuit.