发明名称 DRIVER CIRCUIT EMPLOYING HIGH-SPEED TRI-STATE FOR AUTOMATIC TEST EQUIPMENT
摘要 <p>A driver circuit for automatic test equipment includes an input coupled to respective inputs of first and second amplifiers. The first amplifier can substantially source current only, and the second amplifier can substantially sink current only. The outputs of the first and second amplifiers are coupled together at the output of the driver circuit. The driver circuit includes a disable circuit that receives a drive disable signal and at least one output coupled to the first and second amplifiers. In response to a driver activation signal, the disable circuit drives the first amplifier low and the second amplifier high, thus cutting off output current and effectively tristating the driver circuit.</p>
申请公布号 WO2003085409(P1) 申请公布日期 2003.10.16
申请号 US2003007905 申请日期 2003.03.14
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