| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated-circuit device which is provided with a flip-flop circuit for effectively preventing a data slew and whose density, performance and reliability are high. <P>SOLUTION: The flip-flop circuit having a scan function is constituted by installing a first latch circuit which holds and outputs an input signal of an input terminal by corresponding to a change timing of a clock signal, a changeover circuit which transmits a first input signal or a second input signal to the input signal of the first latch circuit according to a selection signal, and a second latch circuit which receives the clock signal and which fetches a third signal at the same change timing as the clock signal so as to form the first input signal. <P>COPYRIGHT: (C)2004,JPO |
