发明名称 METHOD AND APPARATUS FOR RECOGNIZING WORK ALTITUDE WITH ELEMENT CARRIER FOR SEMICONDUCTOR ELEMENT TEST HANDLER
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for recognizing work altitude of a simple configuration which automatically, quickly, and accurately measures work altitude with an element carrier for resetting. SOLUTION: An element carrier is provided on the upper side of a handler body for vertical and horizontal movement, and comprises a plurality of pickers which, being movable vertically, sucks a semiconductor element to pick up and carry the semiconductor element between a tray and a change kit under a command from a control unit of the handler. It comprises a rising/falling block which is provided on one side of the element carrier for free vertical movement, a touch probe which is vertically provided on the rising/falling block and rises/falls by touching a lower object, a sensing means for sensing rising of the touch probe based on contact between the touch probe and the object, and a drive means which vertically drives the rising/falling block. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003294810(A) 申请公布日期 2003.10.15
申请号 JP20020381612 申请日期 2002.12.27
申请人 MIRE KK 发明人 HWANG HYUN JOO
分类号 G01R31/26;G01R31/28;H01L21/66;(IPC1-7):G01R31/26 主分类号 G01R31/26
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