发明名称 Control method for insulated gate thin film transistor
摘要 The gate threshold voltage is electronically controlled in an insulated gate transistor formed in a semiconductor thin film, such as fully depleted SOI, that is depleted of carriers between first and second principal surfaces. A third semiconductor region of the opposite conductivity type is placed such that it is in contact with the semiconductor thin film. The amount of carriers in the semiconductor thin film is controlled by supplying the semiconductor thin film with carriers of the opposite conductivity type from the third semiconductor region, or by drawing carriers of the opposite conductivity type from the semiconductor thin film into the third semiconductor region. <IMAGE>
申请公布号 EP1353386(A2) 申请公布日期 2003.10.15
申请号 EP20030252252 申请日期 2003.04.09
申请人 SEIKO INSTRUMENTS INC.;HAYASHI, YUTAKA 发明人 HAYASHI, YUTAKA;HASEGAWA, HISASHI;YOSHIDA, YOSHIFUMI;OSANAI, JUN
分类号 H01L27/08;H01L21/8234;H01L21/8238;H01L21/84;H01L27/088;H01L27/092;H01L27/12;H01L29/786 主分类号 H01L27/08
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