发明名称 |
Semiconductor device and production process thereof |
摘要 |
In the production of a semiconductor devices, a surface of the portion (A) corresponding to the chip packaging area of the glass substrate (11) is treated with plasma in a vacuum. A silicon chip (12) is directly bonded through a Coulomb's force generated between radicals of atoms constituting the chip (12) and reactive radicals on the surface of the substrate (11). The substrate (11) includes a wiring pattern (15) having a predetermined configuration and formed in such a manner that a conductor (14) exposed on the glass substrate (11) is connected with an electrode of the silicon chip (12). <IMAGE> |
申请公布号 |
EP1209735(A3) |
申请公布日期 |
2003.10.15 |
申请号 |
EP20010308998 |
申请日期 |
2001.10.23 |
申请人 |
SHINKO ELECTRIC INDUSTRIES CO. LTD. |
发明人 |
MASHINO, NAOHIRO |
分类号 |
H01L23/12;H01L21/48;H01L21/58;H01L21/60;H01L23/538;H01L25/10 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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