发明名称 LIGHT WAVEFORM MEASURING DEVICE AND LIGHT WAVEFORM MEASURING METHOD FOR RECONFIGURING WAVEFORM
摘要 <P>PROBLEM TO BE SOLVED: To provide a measuring device and a method of a light signal by sampling corresponding to an additional high-frequency light signal. <P>SOLUTION: This light signal waveform measuring device has a local oscillator 30 capable of generating light having an unmodulated single frequency or an extremely narrow waveband which is light having a variable frequency, a heterodyne mixer 110 including a first input for receiving a light signal 70 to be measured and a second input for receiving light from the local oscillator 30, a photodetector 120, a low-frequency transmission filter 155, a recording means 160 for recording the output in each frequency acquired when the frequency of the light from the local oscillator 30 is changed gradually, and a waveform reconfiguration means or a data processing means 170 for applying a Fourier transform to the recorded data, deriving the amplitude and the phase of the signal light 70 to be measured, and reconfiguring the signal waveform of a modulated signal 5. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2003294537(A) 申请公布日期 2003.10.15
申请号 JP20020091809 申请日期 2002.03.28
申请人 AGILENT TECHNOL INC 发明人 YAMADA NORIHIDE
分类号 G01J9/00;G01J11/00;H04B10/07;H04B10/516;H04B10/61 主分类号 G01J9/00
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