发明名称 ELECTRONIC COMPONENT INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an electronic component inspection device which surely detects error in taking-out/taking-in of an electronic component. <P>SOLUTION: A placing table 10 is reciprocated by a drive means along a path, and carries an electronic component from a supply part to a collection part through an inspection part. An electronic component is carried to and placed on the placing table 10, and a holding part 9 is used as a supply means or a collection means to take out the electronic component from the placing table 10. The upper surface of the placing table 10 is provided with a recessed part 11 opened and a pair of grooves 12 and 13 formed, to face each other, at two positions sandwiching a component 1 in the recessed part 11. A light projecting element 14 and a light receiving element 15 are provided at an inlet and an outlet of both grooves. The light for detecting a component comes out of the groove 12 to enter the recessed part 11, and reaches the light receiving element 15 through the groove 13. So such phenomenon as the light from the light projecting element 14 detours around the electronic component 1 for malfunction is difficult to occur. The light path is surely shut off by presence of the electronic component 1, and the presence of the electronic component 1 is accurately detected. So, an error in carrying out/carrying in of the component 1 by the holding part 9 is surely detected. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2003294809(A) 申请公布日期 2003.10.15
申请号 JP20020100090 申请日期 2002.04.02
申请人 ANRITSU CORP 发明人 TSUGANE HIRONORI;HONMA MASARU
分类号 G01R31/26;G01R31/00;G01R31/28;H05K13/08 主分类号 G01R31/26
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