发明名称 CMOS image sensor with testing circuit for verifying operation thereof
摘要 The present invention relates to a picture display using CMOS (Complementary Metal Oxide Semiconductor) image sensor; and, more particularly, to a CMOS image sensor having a testing circuit embedded therein and a method for verifying operation of the CMOS image sensor using the testing circuit. The CMOS image sensor according to the present invention includes a control/interface unit for controlling its operation sensor using a state machine and for interfacing the CMOS image sensor with an external system; a pixel array including a plurality of pixels sensing images from an object and generating analogue signals according to an amount of incident light; a converter for converting the analogue signals into digital signals to be processed in a digital logic circuit; and a testing circuit for verifying operations of the converter and the control/interface unit, by controlling the converter.</PTEXT>
申请公布号 US6633335(B1) 申请公布日期 2003.10.14
申请号 US19990258448 申请日期 1999.02.26
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 KWON OH BONG;YANG WOODWARD;LEE SUK JOONG;HWANG GYU TAE
分类号 G01R31/3185;H01L27/146;H03M1/10;H03M1/12;H03M1/56;H04N5/335;H04N5/369;H04N5/374;H04N5/378;H04N17/00;(IPC1-7):H04N3/14 主分类号 G01R31/3185
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