发明名称 Stacked chip scale package structure
摘要 The present invention provides a stacked chip scale package structure, wherein a lower chip and an upper chip are stacked on a substrate. Two rows of bonding pads are disposed on each of the upper and lower chips. The bonding pads on the upper and lower chips are parallel arranged. At least a dummy die is disposed below the suspended portion of the upper chip and at the side of the lower chip as a support during wire bonding. A gap is reserved between the dummy die and the lower chip. The present invention utilizes the design of dummy die to resolve the problem of die crack caused by wire bonding of suspended chip. Therefore, the present invention can flexibly adjust the size and installation direction of the upper chip to meet the requirement of substrate layout, and can also shorten the trace length on the substrate to enhance the electric performance thereof.</PTEXT>
申请公布号 US6633086(B1) 申请公布日期 2003.10.14
申请号 US20020162910 申请日期 2002.06.06
申请人 VATE TECHNOLOGY CO., LTD. 发明人 PENG YI-LIANG;WU KAI-CHIANG
分类号 H01L25/065;(IPC1-7):H01L23/48;H01L23/52 主分类号 H01L25/065
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