| 摘要 |
PURPOSE: A memory device for controlling a sensing timing of a sense amplifier during a test is provided to drive the sense amp more efficiently by making it easy to control a sensing start point of the sense amp. CONSTITUTION: A sense amp part(300) senses and amplifies a signal applied to a bit line. A test mode decoder(100) is enabled by a test mode conversion signal and then decodes an address signal(address) and then outputs it. And a sensing control part(200) outputs a sensing start signal(sg) for the sense amp part to perform a sensing operation by receiving a RAS signal, and controls the above sensing start signal according to an output signal of the test mode decoder.
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