发明名称 SURFACE TREATMENT DEVICE AND ITS METHOD
摘要 PROBLEM TO BE SOLVED: To provide a surface treatment device and its method by which the entire surface of a substrate to be treated can be treated uniformly and appropriately. SOLUTION: A placing table 2 is provided to hold a semiconductor wafer W as a substrate to be treated in a vacuum chamber 1, and an electron beam irradiation mechanism 6 is provided on the ceiling of the vacuum chamber 1 to produce an electron beam EB. The placing table 2 is vertically and freely movable by means of an elevating device 3, thereby freely setting a distance between the electron beam irradiation mechanism 6 and the semiconductor wafer W. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003289068(A) 申请公布日期 2003.10.10
申请号 JP20020322182 申请日期 2002.11.06
申请人 TOKYO ELECTRON LTD 发明人 NAGASEKI KAZUYA;ONISHI TADASHI;MURAKAMI KOICHI;HONDA MINORU
分类号 G03F7/40;H01L21/31;(IPC1-7):H01L21/31 主分类号 G03F7/40
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