| 摘要 |
<p>PURPOSE:To improve the detecting sensitivity of the title device by providing an optical probe which is brought nearer to a part to be measured and contains an electrooptic material and an electric field concentrating electrode which concentrates electric lines of force from the part to be measured to the optical probe. CONSTITUTION:Probe light modulated by means of an electric field at an optical probe 46 is adjusted by means of a Soleli-Babinet compensator 52 so that its bias quantity can become 1/4 wavelength to obtain a linear response and maximum voltage sensitivity after the probe light is reflected by a half mirror 51 and made incident on an analyzer 50. The output light of the analyzer 50 is detected by means of a pair of photodiodes 42 and 44 and detecting signals of the diodes 42 and 44 are displayed on a display device 57 after the signals are processed by means of a sampling detecting device 56 incorporating a differential amplifier 56A and lock-in amplifier 56B. An optical delaying device 54 is actuated synchronously to the sampling detecting device 56 when the device 56 is operated. Therefore, a time-voltage display of an unknown electric signals can be made.</p> |
