发明名称 |
METHOD FOR MONITORING PROCESS DATA OF EACH CHAMBER IN MULTI-CHAMBER EQUIPMENT |
摘要 |
PURPOSE: A method for monitoring process data of each chamber in a multi-chamber equipment is provided to be capable of running the whole multi-chamber equipment except only the process failure generated chamber for improving the productivity and yield of semiconductor wafers, though process failure is generated. CONSTITUTION: The first chamber information of each slot is stored in database when carrying out a main step. After completing a predetermined process in the main step, the second chamber information formed while carrying out the main step in a chamber equipment(10) is compared to the first chamber information of each slot stored in the database by using the slot number of one wafer as a reference, wherein the wafer is completed with a sampling process of a measure step. Then, the exact chamber related with the measured wafer is checked out of the chamber equipment(10).
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申请公布号 |
KR20030078993(A) |
申请公布日期 |
2003.10.10 |
申请号 |
KR20020017728 |
申请日期 |
2002.04.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
OH, JAE SEOK;CHAE, HUI SEON;LEE, SANG HUN;YOON, SANG JIN;JUN, HUI SIK |
分类号 |
H01L21/00;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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