发明名称 METHOD AND APPARATUS FOR MANUFACTURING PROBE FOR SCANNING PROBE MICROSCOPE, AND PROBE MANUFACTURED BY THE SAME METHOD
摘要 PROBLEM TO BE SOLVED: To obtain a probe with carbon nanotubes for a scanning probe microscope which can manufacture in an atmosphere in a short manufacturing time in a mass production and which does not exert an adverse influence on mechanical and electrical characteristics of the nanotubes. SOLUTION: A method for manufacturing the probe for the scanning probe microscope comprises the steps of: opposing the probe 5 of a metal or a semiconductor sharpened at a tip end to an electrode 4 at a small interval in a container 3 for filling a solution 2 for dispersing the carbon nanotubes 7 in an organic solvent; and applying a voltage to the probe 5 and the electrode 4 to adhere the nanotubes 7 to the tip end of the probe 5. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003287488(A) 申请公布日期 2003.10.10
申请号 JP20020089394 申请日期 2002.03.27
申请人 UNISOKU CO LTD 发明人 UEDA KAZUYUKI;YOSHIMURA MASAMITSU;NAGAMURA TOSHIHIKO
分类号 G01Q60/16;G01Q60/38;G01Q70/00;G01Q70/12;G01Q70/16;G01Q90/00;(IPC1-7):G01N13/10;G12B21/02 主分类号 G01Q60/16
代理机构 代理人
主权项
地址